Bring your expertise and join in the discussions!
Chairman: Charvaka Duvvury, Texas Instruments
Discussion groups will occur on Tuesday and Wednesday evenings and are a very important part of the Workshop. Two very interesting discussion groups are offered each evening. Each discussion group is assigned a moderator who has extensive experience with the topic and will help to guide the discussion. However, the actual discussion flow will be at the discretion of those participating in each group. Everyone is encouraged to bring along data and ideas to share on topics that are of particular interest. As the Workshop approaches, please check the IEW web site for updates from the discussion group moderators.
Discussion Group 1:
Transient Latch-up: How to Test for It? How to Design for It?
Moderator: Wolfgang Stadler, Infineon Technologies
Many talk about Transient Latch-up (TLU) but very little is done to address this in a systematic manner. Why is TLU important and what specifically is involved in it? Is TLU related to ESD system level tests? Is there any relationship to static JEDEC latch-up? When do we all agree for a standardized test? Can the IC be designed to be robust against TLU?
Discussion Group 2:
ESD Qualification and ESD Control Methods
Moderator: Reinhold Gaertner, Infineon Technologies
With the recent recommendations on reduction for ESD Target Levels, the focus on ESD control methods has become even more important. This discussion topic intends to address the ESD control methods in existence and what they mean for the new ESD qualification. The industry agrees that the measures to protect against HBM are well described in international standards. But what about CDM control? There is no specific description for this. Most of the measures are already intrinsically implemented, but if the current ESD levels are further reduced are there newer ESD controls that are needed? How should we properly inform and educate the supplier and the customer about ESD control?
Discussion Group 3:
Automotive System ESD Protection
Moderator: Markus Mergens, QPX
The automotive environment and the impact of ESD requirements are not always fully understood. This discussion topic intends to address these issues. Is there something special for the automotive environment? Are the ICs for automotive applications different from consumer ICs? Do they need higher component ESD? How do they tolerate a powered-up system upset due to ESD events? What other tests are important? Are these different from the IEC test?
Discussion Group 4:
How Useful and Reliable are TLP Tools?
Moderator: Leo G. Henry, ESD & TLP Consultants
Both the standard TLP and the Very Fast TLP are used to evaluate HBM and CDM performance respectively. In addition, now CCTLP is proposed for CDM. How good are these tools? Can we use them as back-up for false failures from the testers? What are their limitations? What should one watch out for? Will these tools ever replace actual testers?
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