Work out your ESD issues in a collaborative team of high-level experts!
Special Interest Group Chair: Markus Mergens, QPX
A special interest group (SIG) is a collaborative working team focused on one compelling topic of mutual interest. The SIG program at the IEW has been established to foster collaborative work on important ESD issues and we look forward to continued momentum throughout the year on these topics. The formation of SIGs is encouraged as a natural extension of the discussion group topics or any topic of interest to two or more attendees. Five SIGs are already scheduled for IEW 2010. Attendees are also encouraged to form new SIGs as they see fit. If you would like to form a new SIG please contact Markus Mergens at mergens@qpx-europe.com.
SIG 1: Two-Pin HBM Testing
New technology nodes are uncovering unwanted stresses from HBM tester parasitics and DUT-tester interactions that cause false failures. Today’s high performance modules have more pins than the largest HBM testers. The simplicity of 2-pin HBM testing offers solutions, but its speed is limited. This SIG will discuss HBM performance requirements and tradeoffs along with identifying the changes needed to the ESDA/JEDEC standards for 2-pin testing.
Coordinators: Evan Grund, Grund Technical Solutions and Charvaka Duvvury, Texas Instruments
SIG 2: ESD Data Analysis Software
On a regular basis, ESD engineers process and analyze measurement and/or simulation results from different test methods. They have to extract ESD parameters and manipulate functions over several devices. Spreadsheet programs are one common solution for this type of analysis despite not being designed for ESD data manipulation, which can make the work very tedious. Who should take the lead in the development of such tools: the ESD engineers and/or the ESD tester manufacturers? What are the requirements? Does each of us have his in-house optimized tool? Can we establish a common and open platform and build a user/developer community? At least two software tools will be presented and will be open for the ESD community.
Coordinators: Dimitri Linten, IMEC and David Tremouilles, LAAS-CNRS
SIG 3: System-level ESD Stress
System-level ESD stress, being a concern for system designers for a long time, has now moved into the focus of on-chip ESD protection development as well. Narrowing design windows, declines in achievable HBM and CDM robustness together with shorter system design cycles, demand a clear understanding of the specific requirements of system ESD robustness at the IC design side and a better alignment between system, board, and IC design. This SIG will give an overview of the ongoing working group activities in this field and provides an informal platform for collecting recommendations and ideas for further work in these groups.
Coordinator: Harald Gossner, Infineon Technologies
SIG 4: Transient Latchup (TLU)
There is an ongoing discussion whether the Transient Latch-up standard practice defined by the ESDA (ANSI/ESD SP5.4) really covers all “real world” TLU threats for current products. On the other hand it seems to be clear that transients are becoming increasingly important and there is no doubt that those transients can trigger latch-up. This SIG should collect input from industry experts to support and impact current standardization activities in this field.
Coordinator: Wolfgang Stadler, Infineon Technologies
SIG 5: ESD EDA Tools
Do you have, use, or develop IC design automation and verification tools for ESD protection implementation? Whatever your answer is, our ESD EDA SIG is the place where you should be and share your needs, experience, or suggestions on ESD checks, tools, and methods. We will continue the discussion and the work started in the previous SIG meetings on this exciting topic. An update from the ESDA working group on ESD EDA will be given on the progress and status of the ESD EDA Technical Report. Your inputs will be very useful to the ESD community and customers!
Coordinators: Michael Khazhinsky, Freescale and Vesselin Vassilev, Novorell
Identifying the Opportunity to Form a SIG
Although SIGs may be formed at any time during the year, IEW offers unique opportunities to form a SIG at the workshop. A SIG may be formed just for the duration of IEW or members may choose to extend activities beyond the workshop. IEW strongly supports but does not drive SIGs. The formation of a SIG may be the outcome of a discussion group seeking an opportunity for follow-up interactions after the workshop. It may also result from discussions started during formal IEW activities that individuals would like to continue after the close of IEW. Or, it may be sparked from interactions at another event where there is interest in meeting at IEW and continuing discussions there. When there is a group of identified individuals interested in collaborating on a topic a SIG may be formed. IEW is an excellent nurturing ground to initiate the formation of a SIG.
Forming a SIG at IEW
The IEW SIG Chair or any other IEW Committee Member may be contacted to express interest in forming a SIG at IEW. We can assist in identifying a meeting time/place for the kick-off as well as in advertising the details to workshop attendees. As an outcome of the kickoff meeting, a SIG topic and name should be selected that describes the intent and focus of the team. A brief, one paragraph description of the SIG is helpful in focusing activities as well as in encouraging and attracting new members. For SIGs that will plan to continue after the IEW event, an attendee contact list can be distributed to the members. Also, it may be helpful for a scribe to volunteer to capture and document highlights from the discussions; this maximizes visibility and provides a quick reference for current and new members. Each SIG discussion thus captured should then be circulated to the members.
Maintaining a SIG
A SIG is a flexible and cooperative engagement. The timeframe of a SIG is determined by the membership. A SIG may be very brief in duration to solve an immediate problem or question. Or it may iteratively tackle complex challenges and evolve over time as deemed appropriate and as supported by the members. Membership can change over time and participation levels may change as appropriate for each individual. Rigid meeting procedures can be followed but are not required to be successful. At a minimum, proctored discussion groups and a scribe to document highlights are helpful in maintaining focus on the consensus goals and objectives. SIG outcome summaries, when distributed to members and to the IEW SIG Chair, whether after every discussion or after each achieved milestone, help to maximize visibility, support, and participation on SIG activities. With SIG agreement, the IEW SIG Chair may advertise to attract other individuals to contact, join, and participate in the SIG.
Retiring a SIG
The SIG may be discontinued or retired at any time the members deem appropriate. It is helpful to document the final results and distribute them to the membership, with a courtesy copy to the current IEW SIG Chair. Results from a closing SIG are helpful for current and future SIGs.
IEW 2010 SIG
Name of SIG
SIG head, Affiliation
Purpose: (e.g.) To develop guidelines...
Objective: (e.g.) To use guidelines...
First Task: (e.g.) To collect from SIG members and others the following information:
1)….
Second Task: (e.g.) SIG Leader will organize inputs, without attribution, in a report that will be sent to members for comments.
Members:
Name1, affiliation; email (Leader)
Name2, affiliation; email
Name3, affiliation; email
Etc.
-------------------------
1 Refs… |
