Author: Owen McAteer, 1990
ISBN: 0-07-044838-8; 480 Pages
Order#: EP101  Cost: $85.00

This book is not only a guide to improved ESD control for the ESD specialist, but offers practical information to engineers, technicians, and managers involved in anyway with electronics processing. Factory-tested methods for incorporating and upgrading ESD controls at every level of design, manufacture, quality assurance, and distribution are included. Readers can gain a firm foundation in electrostatic principles to equip themselves to resolve problems and make rational decisions in the ever-changing world of ESD control practices.

Author: Warren Boxleitner, 1988
ISBN: 0-87942-244-0; 128 Pages
Order#: EP102  Cost: $82.00

This book explains how ESD is generated, how it affects electronic equipment, how to design equipment to prevent ESD problems, and explains how they work. Also covered are methods of testing for ESD problems, test hardware, and ways to ensure meaningful results.

Author: Ted Dangelmayer, 1990
ISBN: 0-412-13671-6; 436 Pages; 2nd Edition
Order#: EP103  Cost: $198.00

A comprehensive book that explains how to develop, implement, and manage an ESD control program. It includes changes and additions to auditing techniques, cost benefits data, and materials evaluation. Chapters on common myths, issues related to smaller companies, process controls, ISO 9000, material characterization, and training. New case studies on field-induced failures in the factory, long-distance central office system upsets, and automation-caused failures.

Authors: Ajith Amerasekera and Charvaka Duvvury, 2002
ISBN: 0-470-49871-8; 412 pages; 2nd Edition
Order#: EP105 Cost: 165.00

Presents a practical and systematic approach to ESD device physics, modeling, and design techniques. Also provides detailed coverage of ESD simulation stress models. Provides the means to design protection circuits for a variety of applications, and to diagnose and solve ESD problems in IC products.

Authors: John Koyler and Donald Watson, 1996, 2nd Edition
ISBN: 0-412-08381-7; 338 Pages
Order#: EP106 Cost: $220.00

Revised and expanded edition fully explains the important developments, providing practitioners with state-of-the-art guidance on developing effective static control programs.

Author: Douglas Smith, 1993
ISBN: 0-442-00636-5; 231 Pages
Order#: EP107  Cost: $123.00

This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits, as well as, methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods.

Author: Jonassen, 2002
ISBN: 0-140-207161-2
Order#: EP108  Cost: $140.00

A comprehensive and coherent account of static electric phenomena and concepts based on a mathematical-physical approach. It is intended for the non-specialists interested in understanding the electrostatic concepts, and for the specialized engineer who may not be familiar with the basic fundamentals. This work has been updated to include new and expanded material on charge decay, charge neutralization by air ions, breakdown between conductors with different electrode geometry, and a chapter on electrostatic measurements with special emphasis put on showing the difficulty in relating the voltage of a conductor with a measured field strength.

Authors: Sanjay Dabral and Timothy Maloney, 1998
ISBN: 0-471-25359-6; 305 Pages
Order#: EP109   Cost: $120.00

The first comprehensive guide to ESD protection and I/O design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions. It examines key factors in I/O, and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices.

Author: Albert SZ. H. Wang, 2002

ISBN: 0-7923-7647-1; 303 Pages

Order#: EP110   Cost: $123.00

This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits. Many real world ESD protection circuit design examples are provided.

Authors: Vinson, Bernier, Croft, Liou

ISBN: 1-402-07350-X; 207 Pages

Order#: EP111  Cost: $127.00

ESD Design and Analysis Handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers, and failure analysts. This handbook presents many of the most important areas of the ESD problem and suggests methods for improving them. The key topics covered include the physics of the event, failure analysis, protection, characterization, and simulation techniques.

Author: Steven H. Voldman

ISBN: 0-470-84753-0; 398 Pages

Order#: EP112   Cost: $130.00

This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits, and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. The book covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), and BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies. In addition, it also addresses ESD in advanced CMOS, with discussions on shallow trench isolation (STI), Copper, and Low K materials.

Steven H. Voldman
ISBN: 0-470-84754-9; 379 Pages
Order#: EP113   Cost: $139.00

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD.

R. Welker, R. Nagarajan, C. Newberg, 2006
ISBN: 0-471-41452-2; 498 Pages
Order#: EP114  Cost: $128.00

A practical "how to" guide that effectively deals with the control of both contamination and ESD. This book offers effective strategies and techniques for contamination and electrostatic discharge (ESD) control that can be implemented in a wide range of high-technology industries, including semiconductor, disk drive, aerospace, pharmaceutical, medical device, automobile, and food production manufacturing. The authors set forth a new and innovative methodology that can manage both contamination and ESD, often considered to be mutually exclusive challenges requiring distinct strategies.

Steven H. Voldman, 2006
ISBN: 0-470-84755-7; 398 Pages
Order#: EP115   Cost: $109.00

Electrostatic discharge (ESD) within RF devices can result in the malfunctioning of nearby electronic equipment. This volume is designed as the third in a series of three books addressing electrostatic discharge (ESD) physics, devices, circuits, and design. It will be the first book to address the increasingly important area of ESD within RF devices and circuits.

Kai Esmark, Harald Gossner and Wolfgang Stadler, 2003
ISBN: 0-08-044147-5; 291 Pages
Order#: EP116   Cost: $290.00

Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due to advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now that development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance.

Latchup

Steven H. Voldman, 2007
ISBN: 970-0-470-01642; 450 Pages
Order#: EP117 Cost: $112.00

This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena.

Physics of Semiconductor Devices

S.M. Sze and Kwok K. Ng, 2007
ISBN: 978-0-471-14323-9; 815 Pages
Order#: EP118 Cost: $127.00

Organized to reflect the tremendous advances in device concepts and performance, this third edition contains information on important semiconductor devices. It gives readers detailed descriptions of the underlying physics and performance characteristics of all major bipolar, field-effect, microwave, photonic, and sensor devices.

Printed Circuit Board Design Techniques for EMC Compliance – 2nd Edition

Mark I. Montrose, 2000
ISBN: 978-0-7803-5376-3; 307 Pages
Order#: EP119 Cost: $105.00

The simplified approach to PCB design and layout is based on real-life experience, training, and knowledge. Printed Circuit Board Techniques for EMC Compliance, Second Edition, will help prevent the emission or reception of unwanted RF energy generated by components and interconnects, thus achieving acceptable levels of EMC for electrical equipment. It prepares one for complying with stringent domestic and international regulatory requirements. Also, it teaches how to solve complex problems with a minimal amount of theory and math.

Noise Reduction Techniques in Electronic Systems - 2nd Edition

Henry W. Ott, 1988
ISBN: 0-471-85068-3; 426 Pages
Order#: EP120 Cost: $133.00

This updated and expanded version of the very successful first edition offers new chapters on controlling the emission from electronic systems, especially digital systems, and on low-cost techniques for providing electromagnetic compatibility (EMC) for consumer products sold in a competitive market. There is also a new chapter on the susceptibility of electronic systems to electrostatic discharge. There is more material on FCC regulations, digital circuit noise and layout, and digital circuit radiation. Virtually all the material in the first edition has been retained. Contains a new appendix on FCC EMC test procedures.

Grounding and Shielding Circuits and Interference – Fifth Edition

Ralph Morrison, 2007
ISBN: 978-0-470-09772-4; 193 Pages
Order#: EP121    Cost: $76.00

The fifth edition of Grounding and Shielding has been revised throughout. Material has been added on transmission lines, radiation, and printed circuit design, all of which are of great current interest because of the smaller dimensions of electronic devices.

Ming-Dou Ker and Sheng-Fu Hsu, 2009 – 1st Edition
ISBN: 978-0-470-82407-8; 249 Pages
Order#: EP123 Cost: $140.00
This book on Transient Latchup is very basic in that it is can also be used by non-ESD design engineers. It addresses all (about 6) of the widely known pulse sources of transients which have been known to cause/trigger latchup using a wide range published material. The book compares these sources, and includes any related standards which addresses transient latchup. The book details the mechanism associated with the transient mode and failure. It compares the component-level TLU measurement setup and testing to the system-level test, which also causes latchup. The book then describes how certain/specific designs can reduce latchup to a minimumm and possible elimination for certain technologies. There are examples from the field and simulations to confirm field failures, and the book concludes by showing (with examples) how following design rules is critical to preventing latchup.