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Ordering
Information
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Description |
2008 and 2009 Tutorial Notes are available
in printed format. Each edition contains the actual notes from the
tutorials at the EOS/ESD Symposium. Tutorial notes listed by day include
all courses taught that day. Supplies are limited. |
| Order # |
Cost |
| 08 TUT (Basic) |
$100.00 |
| 08 TUT (On-Chip) |
$100.00 |
| 08 TUT (ESD Circuits) |
$100.00 |
| 08 TUT (System Level-Testing Principles) |
$100.00 |
| 08 TUT (Sun E-G) |
$100.00 |
| 08 TUT (Mon) |
$100.00 |
| 08 TUT (Thurs) |
$100.00 |
| 09 TUT (Basic) |
$100.00 |
| 09 TUT (On-Chip) |
$100.00 |
| 09 TUT (System Level-Principles) |
$100.00 |
| 09 TUT (System Level-Testing) |
$100.00 |
| 09 TUT (Mon) |
$100.00 |
| 09 TUT (Thurs) |
$100.00 |
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| IEW Proceedings |
Workshop Proceedings |
| Year |
Order # |
Format |
Cost |
| 2008 |
IEW-2 |
Book and CD |
$200 |
| 2008 |
IEW-2A |
CD only |
$100 |
| 2007 |
IEW-1 |
Book and CD |
$150 |
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| ESD
Device/Design Seminar Notes |
| From a two-day technical seminar for on-chip ESD protection designers.
The notes are those used for the presentation held in Rome, NY, in April
2008. They cover such topics as: ESD in the Industrial Semiconductor
IC Context; ESD Models and ESD Testing; ESD Device Operation; ESD Circuit
Operation; Technology Impact on ESD Design Choices; Special Circuit
Requirements and Their Impact on ESD; CDM ESD Protection; and Design
Examples and Case Studies. Supplies are limited. |
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Order#: Design Notes
Cost: $350.00 |
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